2021
Hu, Yinghua; Zhang, Yuke; Yang, Kaixin; Chen, Dake; Beerel, Peter A.; Nuzzo, Pierluigi
Fun-SAT: Functional Corruptibility-Guided SAT-Based Attack on Sequential Logic Encryption Proceedings Article
In: 2021 IEEE International Symposium on Hardware Oriented Security and Trust (HOST), IEEE, 2021.
Abstract | Links | BibTeX | Tags: Extract Design Secrets, IP Piracy, Overproduction, Reverse Engineering Attacks, Vulnerability Detection
@inproceedings{Hu2021,
title = {Fun-SAT: Functional Corruptibility-Guided SAT-Based Attack on Sequential Logic Encryption},
author = {Yinghua Hu and Yuke Zhang and Kaixin Yang and Dake Chen and Peter A. Beerel and Pierluigi Nuzzo},
url = {https://doi.org/10.1109/host49136.2021.9702267},
doi = {10.1109/host49136.2021.9702267},
year = {2021},
date = {2021-12-01},
booktitle = {2021 IEEE International Symposium on Hardware Oriented Security and Trust (HOST)},
publisher = {IEEE},
abstract = {The SAT attack has shown to be efficient against most combinational logic encryption methods. It can be extended to attack sequential logic encryption techniques by leveraging circuit unrolling and model checking methods. However, with no guidance on the number of times that a circuit needs to be unrolled to find the correct key, the attack tends to solve many time-consuming Boolean satisfiability (SAT) and model checking problems, which can significantly hamper its efficiency. In this paper, we introduce Fun-SAT, a functional corruptibility-guided SAT-based attack that can significantly decrease the SAT solving and model checking time of a SAT-based attack on sequential encryption by efficiently estimating the minimum required number of circuit unrollings. Fun-SAT relies on a notion of functional corruptibility for encrypted sequential circuits and its relationship with the required number of circuit unrollings in a SAT-based attack. Numerical results show that Fun-SAT can be, on average, 90× faster than previous attacks against state-of-the-art encryption methods, when both attacks successfully complete before a one-day time-out. Moreover, Fun-SAT completes before the time-out on many more circuits.},
keywords = {Extract Design Secrets, IP Piracy, Overproduction, Reverse Engineering Attacks, Vulnerability Detection},
pubstate = {published},
tppubtype = {inproceedings}
}
The SAT attack has shown to be efficient against most combinational logic encryption methods. It can be extended to attack sequential logic encryption techniques by leveraging circuit unrolling and model checking methods. However, with no guidance on the number of times that a circuit needs to be unrolled to find the correct key, the attack tends to solve many time-consuming Boolean satisfiability (SAT) and model checking problems, which can significantly hamper its efficiency. In this paper, we introduce Fun-SAT, a functional corruptibility-guided SAT-based attack that can significantly decrease the SAT solving and model checking time of a SAT-based attack on sequential encryption by efficiently estimating the minimum required number of circuit unrollings. Fun-SAT relies on a notion of functional corruptibility for encrypted sequential circuits and its relationship with the required number of circuit unrollings in a SAT-based attack. Numerical results show that Fun-SAT can be, on average, 90× faster than previous attacks against state-of-the-art encryption methods, when both attacks successfully complete before a one-day time-out. Moreover, Fun-SAT completes before the time-out on many more circuits.