CAD for Assurance of Electronic Systems

SeqL: Scan-Chain Locking and a Broad Security Evaluation

By: Seetal Potluri (North Carolina State University) and Aydin Aysu (North Carolina State University)

Stage: Gate-Level


SeqL locks scan-chains to ensure output corruption in the functional mode of operation. The resulting design is evaluated using a broad class of state-of-the-art logic-locking attacks including SAT, SMT, FALL etc.


Input/Output Interface

  • Input: Original circuit
  • Output: Locked circuit, Attack evaluation results


Linux OS

Licensing Info

Free for research use. Please contact us for industry use.


Potluri, Seetal; Aysu, Aydin; Kumar, Akash

SeqL: Secure Scan-Locking for IP Protection Proceedings Article

In: 2020 21st International Symposium on Quality Electronic Design (ISQED), pp. 7-13, 2020, ISSN: 1948-3287.

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