CAD for Assurance of Electronic Systems
 

Benchmark Template

Stage: (Stage of Production Cycle, e.g., RTL, HDL, etc.)

Summary

<summary of tool>

Contact

<Name, email address>

Dependencies

<list of dependencies>

The benchmarks are available at this link

References

Hoque, Tamzidul; SLPSK, Patanjali; Bhunia, Swarup

Trust Issues in Microelectronics: The Concerns and the Countermeasures Journal Article

In: IEEE Consumer Electronics Magazine, pp. 1-1, 2020, ISSN: 2162-2256.

Abstract | Links | BibTeX